메뉴 건너뛰기




Volumn 5, Issue 24, 2008, Pages 1074-1079

Theoretical simulation of DC and RF performance for AlInN/lnGaN/AlInN double-heterojunction FET using a Monte Carlo approach

Author keywords

Current gain cutoff frequency; Double heterojunction; FET; InGaN; InN; Monte Carlo simulation

Indexed keywords

FIELD EFFECT TRANSISTORS; GALLIUM ALLOYS; GALLIUM NITRIDE; HIGH ELECTRON MOBILITY TRANSISTORS; MESFET DEVICES; MONTE CARLO METHODS; MOSFET DEVICES; NITRIDES; POISSON EQUATION; SEMICONDUCTING GALLIUM;

EID: 58149381871     PISSN: None     EISSN: 13492543     Source Type: Journal    
DOI: 10.1587/elex.5.1074     Document Type: Article
Times cited : (12)

References (7)
  • 1
    • 0035279281 scopus 로고    scopus 로고
    • Application of GaN-bascd heterojunction FETs for advanced wireless communication
    • Y. Ohno and M. Kuzuhara, "Application of GaN-bascd heterojunction FETs for advanced wireless communication," IEEE Trans. Electron Devices, vol. 48, no. 3, pp. 517-523, 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , Issue.3 , pp. 517-523
    • Ohno, Y.1    Kuzuhara, M.2
  • 2
    • 54849240200 scopus 로고    scopus 로고
    • AlGaN/GaN Heterostructure Field-Effedt Transistors on 4H-SiC Substrates with Current-Gain Cutoff Frequency of 190GHz
    • M. Higashiwaki, T. Mimura, and T. Matsui, "AlGaN/GaN Heterostructure Field-Effedt Transistors on 4H-SiC Substrates with Current-Gain Cutoff Frequency of 190GHz," Appl. Phys. Express, vol. 1, p. 021103, 2008.
    • (2008) Appl. Phys. Express , vol.1 , pp. 021103
    • Higashiwaki, M.1    Mimura, T.2    Matsui, T.3
  • 3
    • 33645637950 scopus 로고    scopus 로고
    • Steady-State and Transient Electron Transport Within the HI-V Nitride Semiconductors, GaN, AlN, and InN
    • S. K. O'Lcary, B. E. Foutz, M. S. Shur, and L. F. Eastman, "Steady-State and Transient Electron Transport Within the HI-V Nitride Semiconductors, GaN, AlN, and InN," J. Mater. Sci.: Mater. Electron., vol. 17, pp. 87-126, 2006.
    • (2006) J. Mater. Sci.: Mater. Electron , vol.17 , pp. 87-126
    • O'Lcary, S.K.1    Foutz, B.E.2    Shur, M.S.3    Eastman, L.F.4
  • 4
    • 0024911638 scopus 로고
    • Ensemble Monte Carlo simulation of sub-0.1 μm gate length GaAs MESFETs
    • M. Kuzuhara, T. Itoh, and K. Hess, "Ensemble Monte Carlo simulation of sub-0.1 μm gate length GaAs MESFETs," Solid-State Electron., vol. 32, pp. 1857-1861, 1989.
    • (1989) Solid-State Electron , vol.32 , pp. 1857-1861
    • Kuzuhara, M.1    Itoh, T.2    Hess, K.3
  • 5
    • 0032615133 scopus 로고    scopus 로고
    • Transient electron transport in wurtzite GaN, InN, and AlN
    • B. E. Foutz, S. K. O'Leary, M. S. Shur, and L. F. Eastman, "Transient electron transport in wurtzite GaN, InN, and AlN," J. Appl. Phys., vol. 85, pp. 7727-7734, 1999.
    • (1999) J. Appl. Phys , vol.85 , pp. 7727-7734
    • Foutz, B.E.1    O'Leary, S.K.2    Shur, M.S.3    Eastman, L.F.4
  • 6
    • 0014846935 scopus 로고
    • Monte Carlo determination of electron transport properties in gallium arsenide
    • W. Fawcett, A. D. Boardman, and S. Swain, "Monte Carlo determination of electron transport properties in gallium arsenide," J. Phys. Chem. Solids, vol. 31, pp. 1963-1990, 1970.
    • (1970) J. Phys. Chem. Solids , vol.31 , pp. 1963-1990
    • Fawcett, W.1    Boardman, A.D.2    Swain, S.3
  • 7
    • 0026237569 scopus 로고
    • Transient simulation of semiconductor devices using the Monte-Carlo method
    • M. B. Patil and U. Rayaioli, "Transient simulation of semiconductor devices using the Monte-Carlo method," Solid-State Electron., vol. 34, pp. 1029-1034, 1991.
    • (1991) Solid-State Electron , vol.34 , pp. 1029-1034
    • Patil, M.B.1    Rayaioli, U.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.