Application of dynamic impedance spectroscopy to atomic force microscopy

Science and Technology of Advanced Materials

Volumn 9, Issue 4, 2008, Pages

  Darowicki, Kazimierz ^a   Zieliński, Artur ^a   Kurzydłowski, Krzysztof J ^b  

^a GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Atomic force microscopy; Dynamic electrochemical impedance spectroscopy; Non stationarity

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; CORROSION; ELECTRIC PROPERTIES; ELECTROCHEMICAL CORROSION; IMAGING TECHNIQUES; MATERIALS PROPERTIES; SCANNING; SIZE DISTRIBUTION;

DYNAMIC ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; DYNAMIC IMPEDANCES; ELECTRICAL PROPERTIES; IMPEDANCE SPECTROSCOPIES; MULTI FREQUENCIES; NON-STATIONARITY; SPATIAL DISTRIBUTION OF;

ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;

EID: 58149374766     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1088/1468-6996/9/4/045006     Document Type: Article

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