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Volumn 48, Issue 3, 2001, Pages 293-301

Structural analysis of heavy ion radiation-induced chromosome aberrations by atomic force microscopy

Author keywords

Atomic force microscopy; Chromosome aberration; Heavy ion radiation

Indexed keywords

CARBON; HEAVY ION; NEON;

EID: 0035962808     PISSN: 0165022X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0165-022X(01)00165-8     Document Type: Article
Times cited : (19)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.