UV and VUV radiometry programs at the synchrotron ultraviolet radiation facility (SURF III)

Synchrotron Radiation News

Volumn 19, Issue 4, 2006, Pages 6-13

  Li, Zhigang ^a   Shaw, Ping Shine ^a   Arp, Uwe ^a   Lykke, Keith R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 58149339095     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940880600864558     Document Type: Article

References (18)

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3. Ederer, D.L., Saloman, E.B., Ebner, S.C., and Madden, R.P., 1975. The use of synchrotron radiation as an absolute source of VUV radiation. J. Res. Nat. Bur. Stand. (U.S.), 79a: 761
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13. 13. P.S. Shaw, U. Arp, R. D. Saunders, D.J. Shin, H.W. Yoon, C.E. Gibson, Z. Li, A.C. Parr, and K.R. Lykke, “Synchrotron radiation based irradiance calibration from 200 nm to 400 nm at SURF III,” to be published.
14. Shaw, P.S., Larason, T.C., Gupta, R., Brown, S.W., Vest, R.E., and Lykke, K.R., 2001. The new ultraviolet spectral responsivity scale based on cryogenic radiometer at Synchrotron Ultraviolet Radiation Facility III. Rev. Sci. Instrum., 72: 2242 [CROSSREF]
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17. Shaw, P.S., Gupta, R., and Lykke, K.R., 2005. Stability of photodiodes under irradiation with a 157-nm pulsed excimer laser. Appl. Opt., 44: 197 [INFOTRIEVE][CROSSREF]
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