Structural properties of MgF2 and ZnS in thin film and in multilayer optical coatings

Journal of Physics D: Applied Physics

Volumn 41, Issue 22, 2008, Pages

  Perales, F ^a   De Las Heras, C ^b   Agullo Rueda F ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b INSTITUTO NICOLÁS CABRERA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLITE SIZE; DIFFRACTION; FILM PREPARATION; MULTILAYER FILMS; OPTICAL COATINGS; OPTICAL MULTILAYERS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC SULFIDE;

MICROSTRAIN; MICROSTRUCTURAL PARAMETERS; MULTILAYER OPTICAL COATINGS; THERMAL ANNEALING; X-RAY DIFFRACTIONS; ZNS THIN FILMS;

MULTILAYERS;

EID: 58149279602     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/41/22/225405     Document Type: Article

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