Ohmic contacts to SnS films: Selection and estimation of thermal stability

Journal of Applied Physics

Volumn 104, Issue 12, 2008, Pages

  Devika, M ^a   Reddy, N Koteeswara ^b   Patolsky, F ^b   Gunasekhar, K R ^c  

^a SRI VENKATESWARA UNIVERSITY   (India)

^b TEL AVIV UNIVERSITY   (Israel)

^c INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTORS; ELECTRIC CURRENTS; ELECTRIC PROPERTIES; OHMIC CONTACTS; TIN;

ELECTRICAL PROPERTIES; GROWN STRUCTURES; METALLIZATION; OHMIC BEHAVIORS; ROOM TEMPERATURES; SNS FILMS; THERMAL STABILITIES; VALANCE BANDS; VOLTAGE RANGES;

SILVER;

EID: 58149232493     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3041622     Document Type: Article

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