Effect of silylation hardening on the electrical characteristics of mesoporous pure silica zeolite film

Journal of the Electrochemical Society

Volumn 156, Issue 2, 2009, Pages

  Seo, T ^a   Yoshino, T ^b   Ohnuki, N ^b   Seino, Y ^b   Cho, Y ^a   Hata, N ^b   Kikkawa, T ^a,b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; FOURIER TRANSFORMS; HARDENING; OXIDES; SILICA; VAPORS; ZEOLITES;

DIELECTRIC CONSTANTS; ELECTRICAL CHARACTERISTICS; FOURIER-TRANSFORM; H BONDS; IR SPECTROSCOPIES; LIFE-TIMES; MECHANICAL CHARACTERISTICS; MESOPOROUS; ORDERS OF MAGNITUDES; POROUS SILICAS; PURE SILICA ZEOLITES; SILYLATION; TETRA METHYL CYCLO TETRA SILOXANES; TIME DEPENDENT DIELECTRIC BREAKDOWNS; ZEOLITE FORMATIONS;

SILANES;

EID: 58049086581     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3021041     Document Type: Article

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