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Volumn , Issue , 2008, Pages 9-12
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Mismatch analysis and statistical design at 65 nm and below
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Author keywords
Input offset voltage; Mismatch model; Sense amplifier
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Indexed keywords
GAS DYNAMIC LASERS;
STATIC RANDOM ACCESS STORAGE;
65NM TECHNOLOGIES;
ACTIVE DEVICES;
INPUT OFFSET VOLTAGE;
MEASURED RESULTS;
MISMATCH ANALYSES;
MISMATCH MODEL;
OPTIMIZED USING;
PELGROM MODELS;
RESPONSE SURFACE MODELS;
SENSE AMPLIFIER;
STATISTICAL DESIGNS;
STATISTICAL MODELS;
TRANSISTOR SIZINGS;
INTEGRATED CIRCUITS;
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EID: 57849135551
PISSN: 08865930
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CICC.2008.4672006 Document Type: Conference Paper |
Times cited : (28)
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References (7)
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