Linear analysis of random process variability

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2008, Pages 292-296

  Wang, Victoria ^a   Marković, Dejan ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATE METHODS; ANALOG DESIGNS; BRANCH CURRENTS; CIRCUIT NODES; COMPLEX MODELS; COMPUTATION TIMES; CURRENT NOISES; FITTING ERRORS; LINEAR ANALYSES; MONTE CARLO; NUMBER OF ITERATIONS; OPERATING POINTS; PROCESS VARIABILITIES; PROCESS VARIATIONS; SPEED-UP; STANDARD DEVIATIONS; TOOL MATCHES;

ACOUSTIC NOISE; COMPUTER AIDED DESIGN; MATHEMATICAL MODELS; MONTE CARLO METHODS; PAPER; SIGNAL ANALYSIS; SIGNAL PROCESSING; SPICE; TRANSISTORS;

RANDOM PROCESSES;

EID: 57849129870     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2008.4681588     Document Type: Conference Paper

References (11)

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