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Volumn , Issue , 2005, Pages 317-320

Mismatch modeling and simulation methodology for predicting the output voltage variation of an LCD driver

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; MOSFET DEVICES; SPICE; THRESHOLD VOLTAGE;

EID: 34250721574     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASSCC.2005.251729     Document Type: Conference Paper
Times cited : (1)

References (7)
  • 1
    • 0024754187 scopus 로고
    • Matching Properties of MOS Transistors
    • Oct
    • M. J. M. Pelgrom, A. C. J. Duinmaijer, and A. P. G. Welbers, "Matching Properties of MOS Transistors," IEEE JSSC, vol. 24, no. 5, pp.1433-1440. Oct. 1989.
    • (1989) IEEE JSSC , vol.24 , Issue.5 , pp. 1433-1440
    • Pelgrom, M.J.M.1    Duinmaijer, A.C.J.2    Welbers, A.P.G.3
  • 2
    • 34250787069 scopus 로고    scopus 로고
    • A 5-Parameter Mismatch Model for Short Channel MOS Transistors
    • Sep
    • T. Serrano-Gotarredona, B. Linares-Barranco, "A 5-Parameter Mismatch Model for Short Channel MOS Transistors," ESSCIRC 1999, pp. 440-443, Sep. 1999.
    • (1999) ESSCIRC , vol.1999 , pp. 440-443
    • Serrano-Gotarredona, T.1    Linares-Barranco, B.2
  • 3
    • 0033307322 scopus 로고    scopus 로고
    • A Comprehensive MOSFET Mismatch Model
    • Dec
    • P. G. Drennan and C. C. McAndrew, "A Comprehensive MOSFET Mismatch Model," IEDM 1999, pp. 167-170, Dec. 1999.
    • (1999) IEDM 1999 , pp. 167-170
    • Drennan, P.G.1    McAndrew, C.C.2
  • 4
    • 0035472654 scopus 로고    scopus 로고
    • SPICE Modeling and Quick Estimation of MOSFET Mismatch Based on BSIM3 Model and Parametric Tests
    • Oct
    • Q. Zhang, J. J. Liou, J. R. McMacken, J. Thomson and P. Layman, "SPICE Modeling and Quick Estimation of MOSFET Mismatch Based on BSIM3 Model and Parametric Tests," IEEE JSSC, vol. 36, no. 10, pp. 1592-1595, Oct. 2001.
    • (2001) IEEE JSSC , vol.36 , Issue.10 , pp. 1592-1595
    • Zhang, Q.1    Liou, J.J.2    McMacken, J.R.3    Thomson, J.4    Layman, P.5
  • 5
    • 17644402840 scopus 로고    scopus 로고
    • Physical modeling and prediction of the matching properties of MOSFETs
    • Sep
    • J. A. Croon, S. Decoutere, W. Sansen, and H. E. Maes, "Physical modeling and prediction of the matching properties of MOSFETs," ESSDERC 2004, pp. 193-196, Sep. 2004.
    • (2004) ESSDERC 2004 , pp. 193-196
    • Croon, J.A.1    Decoutere, S.2    Sansen, W.3    Maes, H.E.4
  • 6
    • 0031700520 scopus 로고    scopus 로고
    • Optimizing MOS Transistor Mismatch
    • Jan
    • S. J. Lovett, M. Welten, A. Mathewson, and B. Mason, "Optimizing MOS Transistor Mismatch," IEEE JSSC, vol. 33, no. 1, pp. 147-150, Jan. 1998.
    • (1998) IEEE JSSC , vol.33 , Issue.1 , pp. 147-150
    • Lovett, S.J.1    Welten, M.2    Mathewson, A.3    Mason, B.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.