A design model for random process variability

Proceedings of the 9th International Symposium on Quality Electronic Design, ISQED 2008

Volumn , Issue , 2008, Pages 734-737

  Wang, Victoria ^a   Agarwal, Kanak ^b   Nassif, Sani ^b   Nowka, Kevin ^b   Markovic, Dejan ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b IBM AUSTIN RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT DESIGNS; DESIGN MODELING; DESIGN VARIABLES; ELECTRONIC DESIGNS; INTERNATIONAL SYMPOSIUM; NEW APPROACHES; OPERATING POINTS; POSYNOMIAL; PROCESS VARIABILITY; PROCESS VARIATIONS;

ELECTRONICS ENGINEERING; RANDOM PROCESSES; STATISTICAL METHODS;

PROCESS ENGINEERING;

EID: 49749125050     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2008.4479829     Document Type: Conference Paper

References (11)

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