Fast, non-Monte-Carlo estimation of transient performance variation due to device mismatch

Proceedings - Design Automation Conference

Volumn , Issue , 2007, Pages 440-443

  Jaeha, Kim ^a   Jones, Kevin D ^a   Horowitz, Mark A ^a,b  

^a RAMBUS INC   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

Mismatch; Monte Carlo analysis; Simulation; Variability; Yield

Indexed keywords

CIRCUIT SIMULATION; LOGIC CIRCUITS; MONTE CARLO METHODS; SPURIOUS SIGNAL NOISE; TIME DELAY;

CIRCUIT RESPONSE; DEVICE MISMATCH; LOGIC PATH; SIMULATION COSTS;

TRANSIENT ANALYSIS;

EID: 34547332797     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2007.375204     Document Type: Conference Paper

References (8)

1. H. Masuda, et al., "Challenge: Variability Characterization and Modeling for 65- to 90-nm Processes," in Proc. IEEE Custom Integrated Circuits Conf., 2005, pp. 593-600.
2. F. Schenkel, et al., "A Fast Method for Identifying Matching-Relevant Transistor Pairs," in Proc. IEEE Custom Integrated Circuits Conf., 2001, pp. 361-364.
3. J. Oehm, K. Schumacher, "Quality Assurance and Upgrade of Analog Characteristics by Fast Mismatch Analysis Option in Network Analysis Environment," IEEE J. Solid-State Circuits, July 1993, pp. 865-871.
4. D. E. Hocevar, et al., "Parametric Yield Optimization for MOS Circuit Blocks," IEEE Trans. on Computer-Aided Design, June 1988, pp. 645-658.
5. M. J. M. Pelgrom, et al., "Matching Properties of MOS Transistors," IEEE J. Solid-State Circuits, Oct. 1989, pp. 1433-1439.
6. K. S. Kundert, "Introduction to RF Simulation and Its Application," J. Solid-State Circuits, Sept. 1999, pp. 1298-1319.
7. M. Okumura, et al., "Numerical Noise Analysis for Nonlinear Circuits with a Periodic Large Signal Excitation Including Cyclostationary Noise Sources," IEEE Trans. on Circuits and Systems-I, Sept. 1993, pp. 581-590.
8. A. Demir, et al., "Time-Domain Non-Monte Carlo Noise Simulation for Nonlinear Dynamic Circuits with Arbitrary Excitations," IEEE Trans. on Computer-Aided Design, May 1996, pp. 493-505.