Ellipsometric characterization of PbI2 thin film on glass

Physica B: Condensed Matter

Volumn 404, Issue 1, 2009, Pages 1-6

  Ahmad, A ^a   Saq'an, S ^a   Lahlouh, B ^b   Hassan, M ^c   Alsaad, A ^a   El Nasser, H ^d  

^a JORDAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Jordan)

^b UNIVERSITY OF JORDAN   (Jordan)

^c PRINCESS SUMAYA UNIVERSITY FOR TECHNOLOGY   (Jordan)

^d AL AL BAYT UNIVERSITY   (Jordan)

Author keywords

Band gap; Ellipsometry; Lead iodide; Optical properties; Urbach's energy

Indexed keywords

ABSORPTION; ELLIPSOMETRY; ENERGY GAP; EXPERIMENTS; GALLIUM ALLOYS; GLASS; MODEL STRUCTURES; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; THIN FILM DEVICES; THIN FILMS;

AB SORPTION COEFFICIENTS; BAND EDGES; BAND GAP; CAUCHY DISPERSION FORMULAS; CORNING GLASSES; EXPERIMENTAL VALUES; FIRST DERIVATIVES; INCIDENT PHOTON ENERGIES; INDEX OF REFRACTIONS; LEAD IODIDE; LIGHT WAVELENGTHS; OPTICAL BANDS; POLYCRYSTAL LINES; STRUCTURAL MODELS; TRANSITION BANDS; TRANSMISSION DATUMS; URBACH'S ENERGY;

OPTICAL FILMS;

EID: 57749189101     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2008.09.041     Document Type: Article

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