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Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 21, 2008, Pages

Two-dimensional magnetic resonance force microscopy using full-volume Fourier and Hadamard encoding

(8) Eberhardt, Kai W a Hunkeler, Andreas a Meier, Urban a Tharian, Joy b Mouaziz, Schahrazede c Boero, Giovanni c Brugger, Jürgen c Meier, Beat H a

a ETH ZURICH (Switzerland)

b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY (Switzerland)

c EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 57649094350 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.78.214401 Document Type: Article

Times cited : (10)

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