Fast magnetic resonance force microscopy with Hadamard encoding

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 18, 2007, Pages

  Eberhardt, Kai W ^a   Degen, Christian L ^a,b   Meier, Beat H ^a  

^a ETH ZURICH   (Switzerland)

^b IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549040400     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.180405     Document Type: Article

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