Charge storage characteristics of Mo nanocrystal dependence on Mo oxide reduction

Applied Physics Letters

Volumn 93, Issue 22, 2008, Pages

  Lin, Chao Cheng ^a   Chang, Ting Chang ^b   Tu, Chun Hao ^a   Chen, Wei Ren ^a   Hu, Chih Wei ^a   Sze, Simon M ^a   Tseng, Tseung Yuen ^a   Chen, Sheng Chi ^c   Lin, Jian Yang ^c  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^c NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; MOLYBDENUM; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; OXYGEN; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; RAPID THERMAL ANNEALING; RAPID THERMAL PROCESSING; REDOX REACTIONS; SEMICONDUCTOR QUANTUM DOTS; SILICIDES; SILICON COMPOUNDS;

CHARGE STORAGE CHARACTERISTICS; ELECTRICAL MEASUREMENTS; MEMORY WINDOWS; OXIDE REDUCTIONS; SILICIDE LAYERS; SPECTRA ANALYSIS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 57349180679     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3039065     Document Type: Article

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