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Volumn 16, Issue 25, 2008, Pages 21039-21052

Numerical prediction of minimum sub-diffraction-limit image generated by silver surface plasmon lenses

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTROMAGNETIC WAVE POLARIZATION; FINITE DIFFERENCE TIME DOMAIN METHOD; IMAGE ANALYSIS; NANOTECHNOLOGY; PLASMONS; SILVER; SURFACE PLASMON RESONANCE;

EID: 57349124920     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.021039     Document Type: Article
Times cited : (7)

References (13)
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  • 4
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    • T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, Near-field microscopy through a SiC superlens, Science 3.13(15), 1595 (2006).
    • T. Taubner, D. Korobkin, Y. Urzhumov, G. Shvets, and R. Hillenbrand, "Near-field microscopy through a SiC superlens," Science 3.13(15), 1595 (2006).
  • 5
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  • 6
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    • T. Xu, Y. Zhao, J. Ma, C. Wang, J. Cui, C. Du, and X. Luo, "Sub-diffraction-limited interference photo lithography with metamaterials," Opt. Express 16(18), 13,579-13,584 (2008).
  • 7
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    • Optical properties of metallic films for verticalcavity optoelectronic devices
    • A. D. Rakić, A. B. Djurišić, J. M. Dlazar, and M. L. Majewski, "Optical properties of metallic films for verticalcavity optoelectronic devices," Appl. Opt. 37(22), 5271-5283 (1998).
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  • 9
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  • 10
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  • 13
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.