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Applied Physics Letters

Volumn 93, Issue 22, 2008, Pages

Effect of oxygen vacancy on ferromagnetism and electric transport of bulk polycrystalline (In0.8Mo0.05Fe0.15) 2O3

(6) Zhao, B C a Ho, H W a Xia, B a Tan, L H a Huan, A C a Wang, L a

a NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETISM; MOLYBDENUM; OXYGEN; SINTERING; TRANSPORT PROPERTIES; VACANCIES;

AC TRANSPORT MEASUREMENTS; EFFECT OF OXYGENS; ELECTRIC TRANSPORT PROPERTIES; ELECTRIC TRANSPORTS; ELECTRONIC CHARACTERIZATIONS; ELECTRONIC TRANSPORT PROPERTIES; INTRINSIC FERROMAGNETISMS; POLYCRYSTAL LINES; SINTERING PRESSURES; STRUCTURAL CHARACTERIZATIONS; X-RAY DIFFRACTIONS;

OXYGEN VACANCIES;

EID: 57349084112 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3039807 Document Type: Article

Times cited : (17)

References (16)

1
- 0032516694
- 0036-8075 10.1126/science.281.5379.951.
- H. Ohno, Science 0036-8075 10.1126/science.281.5379.951 281, 951 (1998).
- (1998) Science , vol.281 , pp. 951
- Ohno, H.¹

2
- 42749109092
- 0031-9007 10.1103/PhysRevLett.87.026602.
- M. Tanaka and Y. Higo, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.87. 026602 87, 026602 (2001).
- (2001) Phys. Rev. Lett. , vol.87 , pp. 026602
- Tanaka, M.¹ Higo, Y.²

3
- 0041520973
- 0036-8075 10.1126/science.1086608.
- D. Chiba, M. Yamanouchi, F. Matsukura, and H. Ohno, Science 0036-8075 10.1126/science.1086608 301, 943 (2003).
- (2003) Science , vol.301 , pp. 943
- Chiba, D.¹ Yamanouchi, M.² Matsukura, F.³ Ohno, H.⁴

4
- 0034635396
- 0036-8075 10.1126/science.287.5455.1019.
- T. Dietl, H. Ohno, F. Matsukura, J. Clibert, and D. Ferand, Science 0036-8075 10.1126/science.287.5455.1019 287, 1019 (2000).
- (2000) Science , vol.287 , pp. 1019
- Dietl, T.¹ Ohno, H.² Matsukura, F.³ Clibert, J.⁴ Ferand, D.⁵

5
- 0037258011
- 0021-8979 10.1063/1.1517164.
- S. J. Pearton, C. R. Abernathy, M. E. Overberg, G. T. Thaler, D. P. Norton, N. Theodoropoulou, A. F. Hebard, and Y. D. Park, J. Appl. Phys. 0021-8979 10.1063/1.1517164 93, 1 (2003).
- (2003) J. Appl. Phys. , vol.93 , pp. 1
- Pearton, S.J.¹ Abernathy, C.R.² Overberg, M.E.³ Thaler, G.T.⁴ Norton, D.P.⁵ Theodoropoulou, N.⁶ Hebard, A.F.⁷ Park, Y.D.⁸

6
- 0016594802
- 0013-4651 10.1149/1.2134117.
- J. C. C. Fan, and F. J. Bachner, J. Electrochem. Soc. 0013-4651 10.1149/1.2134117 122, 1719 (1975).
- (1975) J. Electrochem. Soc. , vol.122 , pp. 1719
- Fan, J.C.C.¹ Bachner, F.J.²

7
- 21044432098
- 0003-6951 10.1063/1.1851618.
- J. He, S. F. Xu, Y. K. Yoo, Q. Xue, H. C. Lee, S. Cheng, X. -D. Xiang, G. Dionne, and I. Takeuchi, Appl. Phys. Lett. 0003-6951 10.1063/1.1851618 86, 052503 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 052503
- He, J.¹ Xu, S.F.² Yoo, Y.K.³ Xue, Q.⁴ Lee, H.C.⁵ Cheng, S.⁶ Xiang, X.-D.⁷ Dionne, G.⁸ Takeuchi, I.⁹

8
- 39149118384
- 0953-8984 10.1088/0953-8984/19/23/236224.
- D. B́rardan and E. Guilmeau, J. Phys.: Condens. Matter 0953-8984 10.1088/0953-8984/19/23/236224 19, 236224 (2007).
- (2007) J. Phys.: Condens. Matter , vol.19 , pp. 236224
- B́rardan, D.¹ Guilmeau, E.²

9
- 34547681534
- 0003-6951 10.1063/1.2757589.
- O. D. Jayakumar, I. K. Gopalakrishnan, S. K. Kulshreshtha, A. Gupta, K. V. Rao, D. V. Louzguine-Luzgin, A. Inoue, P. -A. Glans, J. -H. Guo, K. Samanta, M. K. Singh, and R. S. Katiyar, Appl. Phys. Lett. 0003-6951 10.1063/1.2757589 91, 052504 (2007).
- (2007) Appl. Phys. Lett. , vol.91 , pp. 052504
- Jayakumar, O.D.¹ Gopalakrishnan, I.K.² Kulshreshtha, S.K.³ Gupta, A.⁴ Rao, K.V.⁵ Louzguine-Luzgin, D.V.⁶ Inoue, A.⁷ Glans, P.-A.⁸ Guo, J.-H.⁹ Samanta, K.¹⁰ Singh, M.K.¹¹ Katiyar, R.S.¹²

10
- 37549022990
- 0003-6951 10.1063/1.2815661.
- D. W. Chu, Y. P. Zeng, D. J. Jiang, and Z. M. Ren, Appl. Phys. Lett. 0003-6951 10.1063/1.2815661 91, 262503 (2007).
- (2007) Appl. Phys. Lett. , vol.91 , pp. 262503
- Chu, D.W.¹ Zeng, Y.P.² Jiang, D.J.³ Ren, Z.M.⁴

11
- 33750212743
- 0163-1829 10.1103/PhysRevB.74.165321.
- Z. G. Yu, J. He, S. Xu, Q. Xue, O. M. J. van't Erve, B. T. Jonker, M. A. Marcus, Y. K. Yoo, S. Cheng, and X. D. Xiang, Phys. Rev. B 0163-1829 10.1103/PhysRevB.74.165321 74, 165321 (2006).
- (2006) Phys. Rev. B , vol.74 , pp. 165321
- Yu, Z.G.¹ He, J.² Xu, S.³ Xue, Q.⁴ Van'T Erve, O.M.J.⁵ Jonker, B.T.⁶ Marcus, M.A.⁷ Yoo, Y.K.⁸ Cheng, S.⁹ Xiang, X.D.¹⁰

12
- 13644283001
- 0003-6951 10.1063/1.1854720.
- Y. K. Yoo, Q. Xue, H. -C. Lee, S. Cheng, X. -D. Xiang, G. F. Dionne, S. Xu, J. He, Y. S. Chu, S. D. Preite, S. E. Lofland, and I. Takeuchi, Appl. Phys. Lett. 0003-6951 10.1063/1.1854720 86, 042506 (2005).
- (2005) Appl. Phys. Lett. , vol.86 , pp. 042506
- Yoo, Y.K.¹ Xue, Q.² Lee, H.-C.³ Cheng, S.⁴ Xiang, X.-D.⁵ Dionne, G.F.⁶ Xu, S.⁷ He, J.⁸ Chu, Y.S.⁹ Preite, S.D.¹⁰ Lofland, S.E.¹¹ Takeuchi, I.¹²

13
- 58149280090
- 0953-8984
- H. W. Ho, B. C. Zhao, B. Xia, S. L. Huang, Y. Wu, J. G. Tao, A. C. H. Huan, and L. Wang, J. Phys.: Condens. Matter 20, 475204 (2008). 0953-8984
- (2008) J. Phys.: Condens. Matter , vol.20 , pp. 475204
- Ho, H.W.¹ Zhao, B.C.² Xia, B.³ Huang, S.L.⁴ Wu, Y.⁵ Tao, J.G.⁶ Huan, A.C.H.⁷ Wang, L.⁸

14
- 37549061383
- 0003-6951 10.1063/1.2828041.
- S. J. Hu, S. S. Yan, X. L. Lin, X. X. Yao, Y. X. Chen, G. L. Liu, and L. M. Mei, Appl. Phys. Lett. 0003-6951 10.1063/1.2828041 91, 262514 (2007).
- (2007) Appl. Phys. Lett. , vol.91 , pp. 262514
- Hu, S.J.¹ Yan, S.S.² Lin, X.L.³ Yao, X.X.⁴ Chen, Y.X.⁵ Liu, G.L.⁶ Mei, L.M.⁷

15
- 0038620966
- 0036-8075 10.1126/science.285.5433.1540.
- M. Fath, S. Freisem, A. A. Menovsky, Y. Tomioka, J. Aarts, and J. A. Mydosh, Science 0036-8075 10.1126/science.285.5433.1540 285, 1540 (1999).
- (1999) Science , vol.285 , pp. 1540
- Fath, M.¹ Freisem, S.² Menovsky, A.A.³ Tomioka, Y.⁴ Aarts, J.⁵ Mydosh, J.A.⁶

16
- 0037523411
- 0163-1829 10.1103/PhysRevB.67.174408.
- J. Wu and C. Leighton, Phys. Rev. B 0163-1829 10.1103/PhysRevB.67.174408 67, 174408 (2003).
- (2003) Phys. Rev. B , vol.67 , pp. 174408
- Wu, J.¹ Leighton, C.²

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