Degradation-free dielectric property using bismuth layer-structured dielectrics having natural superlattice structure

Journal of the Ceramic Society of Japan

Volumn 116, Issue 1360, 2008, Pages 1249-1254

  Funakubo, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Dielectric property; Layered ferroelectric thin film; Natural superlatice

Indexed keywords

BISMUTH; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES OF SOLIDS; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; NANOSTRUCTURES; OXIDE FILMS; THIN FILMS;

BISMUTH LAYER-STRUCTURED; EPITAXIALLY GROWN; LAYERED FERROELECTRIC THIN FILM; NATURAL SUPERLATICE; NATURAL SUPERLATTICES; PERIODIC NANOSTRUCTURE; PSEUDOPEROVSKITE; RANDOM ORIENTATIONS;

DIELECTRIC PROPERTIES;

EID: 57149145409     PISSN: 18820743     EISSN: 13486535     Source Type: Journal    
DOI: 10.2109/jcersj2.116.1249     Document Type: Review

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