SCOPUS 정보 검색 플랫폼

Volumn 104, Issue 10, 2008, Pages

Optical properties of silicon nanocrystals in silica: Results from spectral filtering effect, m-line technique, and x-ray photoelectron spectroscopy

(7) Khriachtchev, Leonid a Nikitin, Timur a Oton, Claudio J b Velagapudi, Rama c Sainio, Jani c Lahtinen, Jouko c Novikov, Sergei c

a UNIVERSITY OF HELSINKI (Finland)

b UNIVERSITY OF SOUTHAMPTON (United Kingdom)

c AALTO UNIVERSITY (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SPECTROSCOPY; LIGHT REFRACTION; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NONMETALS; OPTICAL MATERIALS; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; ORGANIC POLYMERS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; PLANAR WAVEGUIDES; REFRACTIVE INDEX; REFRACTOMETERS; SILICA; SILICON; SILICON COMPOUNDS; SPECTRUM ANALYSIS; WAVEGUIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS SI; BULK MATERIALS; BULK SILICONS; CRYSTALLINE AND AMORPHOUS SILICONS; DEPTH DEPENDENCES; EXTINCTION COEFFICIENTS; FILTERING EFFECTS; HIGH TRANSPARENCIES; HIGHER TEMPERATURES; NANOSCALE; OPTICAL DISPERSIONS; RAMAN INTENSITIES; SILICA LAYERS; SILICON NANOCRYSTALS; SILICON OXIDES; SILICON SUBOXIDES; STRUCTURAL COMPONENTS; X-RAY PHOTOELECTRON SPECTROSCOPIES;

AMORPHOUS SILICON;

EID: 57049151279 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3010304 Document Type: Article

Times cited : (25)

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