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Volumn 86, Issue 10, 1999, Pages 5601-5608

Raman scattering from very thin Si layers of Si/SiO2 superlattices: Experimental evidence of structural modification in the 0.8-3.5 nm thickness region

(5) Khriachtchev, Leonid a Räsänen, Markku a Novikov, Sergei b Kilpelä, Olli b Sinkkonen, Juha b

a UNIVERSITY OF HELSINKI (Finland)

b AALTO UNIVERSITY (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000382537 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.371567 Document Type: Article

Times cited : (61)

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