Kinetics of surface atoms during phase transition of Sc-O/W(1 0 0) system at high temperature studied by Auger electron spectroscopy

Surface Science

Volumn 602, Issue 24, 2008, Pages 3696-3705

  Nakanishi, Y ^a   Nagatomi, T ^a   Takai, Y ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Auger electron spectroscopy; In situ characterization; Phase transition; Sc O W(1 0 0) emitter; Semi empirical models and model calculations

Indexed keywords

ADSORPTION; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; AUGERS; DESORPTION; ELECTRON SPECTROSCOPY; GAS ADSORPTION; OXYGEN; PHASE TRANSITIONS; PROBABILITY DENSITY FUNCTION; SCANDIUM; SELF ASSEMBLED MONOLAYERS; SEMICONDUCTOR DOPING; STOICHIOMETRY; SURFACE CHEMISTRY; SURFACE DIFFUSION; SURFACE PHENOMENA; SURFACE REACTIONS; SURFACE SEGREGATION; TUNGSTEN COMPOUNDS; VACUUM; WORK FUNCTION;

ELECTRIC DIPOLES; EXCESS OXYGENS; HIGH TEMPERATURES; IN SITU CHARACTERIZATION; KINETICS MODELS; O COMPLEXES; OXYGEN ADSORPTIONS; OXYGEN DESORPTIONS; SC-O/W(1 0 0) EMITTER; SEMI-EMPIRICAL MODELS AND MODEL CALCULATIONS; SURFACE ATOMS; SURFACE COVERAGES;

AUGER ELECTRON SPECTROSCOPY;

EID: 57049119579     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.10.005     Document Type: Article

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