Surface structure of Sc-O/W(100) system used as schottky emitter at high temperature

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 9 A, 2004, Pages 6352-6353

  Iida, Shin Ichi ^a   Nakanishi, Yousuke ^a   Nagatomi, Takaharu ^a   Tarai, Yoshizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Auger electron spectroscopy (AES); Low energy electron diffraction (LEED); Sc O W(100); Schottky emitter; Work function

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON EMISSION; HIGH TEMPERATURE EFFECTS; LOW ENERGY ELECTRON DIFFRACTION; SCANDIUM; SPUTTERING; TUNGSTEN;

BASE PRESSURE; CYLINDRICAL MIRROR ANALYZERS (CMA); SCHOTTKY EMITTER; WORK FUNCTIONS;

SURFACE STRUCTURE;

EID: 9144237794     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.6352     Document Type: Article

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