Effects of oxygen atmosphere on surface properties of Sc-O/W(100) system as Schottky emitter at high temperature

Surface and Interface Analysis

Volumn 38, Issue 12-13, 2006, Pages 1594-1597

  Nakanishi, Y ^a   Nagatomi, T ^a   Takai, Y ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Auger electron spectroscopy (AES); Low energy electron diffraction (LEED); Oxygen exposure; Sc O W(100) emitter; Work function measurement

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; PARTIAL PRESSURE; ULTRAHIGH VACUUM;

OXYGEN EXPOSURE; SCHOTTKY EMITTER; WORK FUNCTION MEASUREMENT;

OXYGEN;

EID: 33845917389     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2415     Document Type: Conference Paper

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