Atomic force microscopy and atomic force acoustic microscopy characterization of photo-induced changes in some Ge-As-S amorphous films

Thin Solid Films

Volumn 517, Issue 5, 2009, Pages 1837-1840

  Knotek, P ^a   Tichy L ^a  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Amorphous materials; Atomic force microscopy; Chalcogenide glass; Optical properties; Photo induced changes

Indexed keywords

ACOUSTIC MICROSCOPES; ACOUSTIC VARIABLES MEASUREMENT; ACOUSTICS; AMORPHOUS MATERIALS; ARSENIC; ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; GERMANIUM; MATERIALS PROPERTIES; OPTICAL GLASS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; SURFACE STRUCTURE; THERMAL EVAPORATION; THICK FILMS;

ANNEALED FILMS; ATOMIC FORCE ACOUSTIC MICROSCOPIES; ATOMIC FORCES; BAND GAPS; CHALCOGENIDE GLASS; DO-MAINS; PHOTO-INDUCED CHANGES; PHOTOEXPANSION;

AMORPHOUS FILMS;

EID: 57049115422     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.09.041     Document Type: Article

References (33)

1. Tanaka K., Nakagawa T., and Odajima A. Philos. Mag. Lett. B 54 (1986) L3
2. Vateva E., Skordeva E., and Arsova D. Phil. Mag. B 67 (1993) 225
3. Petkov K., and Dinev B. J. Mater. Sci. 29 (1994) 468
4. Vateva E., and Skordeva E. J. Optoelectron. Adv. Mater. 4 (2002) 3
5. Vateva E., Arsova D., Skordeva E., and Pamukchieva V. J. Non-Cryst. Solids 326/327 (2003) 243
6. Stabl M., and Tichy L. Optical Materials 27 (2004) 549
7. Stabl M., and Tichy L. Solid. St. Sci. 7 (2005) 201
8. Arsova D., Skordeva E., Pamukchieva V., and Vateva E. J. Optoelectron. Adv. Mater. 7 (2005) 1259
9. Arsova D., Beeva K., Vateva E., Pamukchieva V., Beev K., and Sainov S. J. Optoelectron. Adv. Mater. 9 (2007) 3115
10. Yakuphanoglu F., Arsova D., and Vateva E. J. Optoelectron. Adv. Mater. 9 (2007) 334
11. Tanaka K. Rev. Solid. State Sci. 4 (1990) 641
12. Utsugy Y. Phys. Stat. Sol. (b) 212 (1999) R9
13. Hisakuni H., and Tanaka Ke. Appl. Phys. Lett. 65 (1994) 2925
14. Tanaka K., Saitoh A., and Terakado N. J. Optoelectron. Adv. Mater. 8 (2006) 2058
15. Shimakawa K., and Ikeda Y. J. Optoelectron. Adv. Mater. 8 (2006) 2097
16. Yamanaka K., and Nakano S. Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers 35 (1996) 3787
17. Rabe U., Amelio S., Kester E., Scherer V., Hirsekorn S., and Arnold W. Ultrasonics 38 (2000) 430
18. Kester E., Rabe U., Presmanes L., Tailhades P., and Arnold W. J. Phys. Chem. Solids 61 (2000) 1275
19. Tauc J. Amorphous and Liquid Semiconductors (1974), Plenum, New York 178
20. Pankowe J. Optical Processes in Semiconductors (1971), Prentice Hall, Englewood Cliffs, NJ 93
21. ISO 4287:1997 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Terms, definitions and surface texture parameters, American National Standards Institute, 1997.
22. Gwyddion - Free SPM data analysis software; v. 2.7; P. Klapetek, D. Nečas, Ch. Anderson.
23. Origin software, v. 6.1; OriginLab Corp., Northampton, MA (USA).
24. Pytela O. Chemometrics (2000), University of Pardubice (in Czech lang.)
25. Falt S., Wagberg L., Vesterlind E.L., and Larsson P.T. Cellulose 11 (2004) 151
26. Sczech R., and Riegler H. J. Colloid Interface Sci. 301 (2006) 376
27. Tanaka K. J. Non-Cryst. Solids 35/36 (1980) 1023
28. Tanaka K., and Ohtsuka Y. J. Appl. Phys. 49 (1978) 6132
29. Hamanaka H., Tanaka K., Matsuda A., and Iizima S. Solid State Commun. 19 (1976) 499
30. Kerner R. Stochastic matrix and self-organization in glasses. In: Thorpe M.F., and Tichy L. (Eds). Properties and Applications of Amorphous Materials, NATO Science Series, II. Mathematics. Physics and Chemistry vol. 9 (2001), Kluwer Academic Publishers, Dordrecht 177
31. Munzar M., Tichy L., and Ticha H. Current App. Phys. 2 (2002) 181
32. Tikhomirov V., Seddon A.B., Asatryan K., Galstian T.V., and Vallee R. J. Non-Cryst. Solids 326/327 (2003) 205
33. Tanaka K. Phys. Rev. B 57 (1998) 5163