Molecularly smooth cellulose surfaces for adhesion studies

Journal of Colloid and Interface Science

Volumn 301, Issue 2, 2006, Pages 376-385

  Sczech, Ronny ^a   Riegler, Hans ^a  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

Adhesion; Cellulose; Cellulose surfaces; Polyelectrolytes; Thin films

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POLYELECTROLYTES; SILICON WAFERS; SURFACE TREATMENT; THIN FILMS;

ADSORPTION SYMMETRY; CELLULOSE SURFACES; STICKING; WAFER SURFACES;

CELLULOSE;

CELLULOSE; POLYELECTROLYTE;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; CONCENTRATION (PARAMETERS); CONTACT ANGLE; FILM; INFRARED SPECTROSCOPY; MASS SPECTROMETRY; MOLECULAR DYNAMICS; MOLECULAR INTERACTION; PRIORITY JOURNAL; SURFACE PROPERTY; X RAY DIFFRACTION;

CELLULOSE;

EID: 33746910635     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2006.05.021     Document Type: Article

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