메뉴 건너뛰기




Volumn 29, Issue 12, 2008, Pages 1389-1391

Metal nanocrystal memory with Pt single- and dual-layer NC with low-leakage Al2O3 blocking dielectric

Author keywords

Dual layer (DL); Flash memory; Metal nano crystal (NC)

Indexed keywords

DATA STORAGE EQUIPMENT; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; PLATINUM; PLATINUM METALS; SEMICONDUCTOR STORAGE; SONOLUMINESCENCE; WINDOWS;

EID: 57049083963     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2008.2007308     Document Type: Article
Times cited : (33)

References (9)
  • 1
    • 57049089401 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, ITRS, Online, Available
    • International Technology Roadmap for Semiconductors, ITRS 2007. [Online]. Available: http://www.itrs.net
    • (2007)
  • 3
    • 0036714604 scopus 로고    scopus 로고
    • Metal nanocrystal memories - Part I: Device design and fabrication
    • Sep
    • Z. Liu, C. Lee, V. Narayanan, G. Pei, and E. C. Kan, "Metal nanocrystal memories - Part I: Device design and fabrication," IEEE Trans. Electron Devices, vol. 49, no. 9, pp. 1606-1613, Sep. 2002.
    • (2002) IEEE Trans. Electron Devices , vol.49 , Issue.9 , pp. 1606-1613
    • Liu, Z.1    Lee, C.2    Narayanan, V.3    Pei, G.4    Kan, E.C.5
  • 4
    • 33847725490 scopus 로고    scopus 로고
    • Enhancement of memory window in short channel non-volatile memory devices using double layer tungsten nanocrystals
    • S. K. Samanta, P. K. Singh, W. J. Yoo, G. Samudra, Y.-C. Yeo, L. K. Bera, and N. Balasubramanian, "Enhancement of memory window in short channel non-volatile memory devices using double layer tungsten nanocrystals," in IEDM Tech. Dig., 2005, pp. 170-173.
    • (2005) IEDM Tech. Dig , pp. 170-173
    • Samanta, S.K.1    Singh, P.K.2    Yoo, W.J.3    Samudra, G.4    Yeo, Y.-C.5    Bera, L.K.6    Balasubramanian, N.7
  • 5
    • 39749179836 scopus 로고    scopus 로고
    • Extensive reliability analysis of tungsten dot NC devices embedded in HfAlO lugh-k dielectric under NAND (FN/FN) operation
    • P. K. Singh and A. Nainani, "Extensive reliability analysis of tungsten dot NC devices embedded in HfAlO lugh-k dielectric under NAND (FN/FN) operation," in Proc. IPFA, 2007, pp. 197-201.
    • (2007) Proc. IPFA , pp. 197-201
    • Singh, P.K.1    Nainani, A.2
  • 6
    • 50249146274 scopus 로고    scopus 로고
    • Development of a 3D simulator for metal nanocrystal (NC) Flash memories under NAND operation
    • A. Nainani, S. Palit, P. K. Singh, U. Ganguly, N. Krishna, J. Vasi, and S. Mahapatra, "Development of a 3D simulator for metal nanocrystal (NC) Flash memories under NAND operation," in IEDM Tech. Dig., 2007, pp. 947-950.
    • (2007) IEDM Tech. Dig , pp. 947-950
    • Nainani, A.1    Palit, S.2    Singh, P.K.3    Ganguly, U.4    Krishna, N.5    Vasi, J.6    Mahapatra, S.7
  • 7
    • 0041409576 scopus 로고    scopus 로고
    • Impact of crystal size and tunnel dielectric on semiconductor nanocrystal memory performance
    • Sep
    • M. She and T.-J. King, "Impact of crystal size and tunnel dielectric on semiconductor nanocrystal memory performance," IEEE Trans. Electron Devices, vol. 50, no. 9, pp. 1934-1940, Sep. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , Issue.9 , pp. 1934-1940
    • She, M.1    King, T.-J.2
  • 8
    • 8144221080 scopus 로고    scopus 로고
    • Nonvolatile Flash memory device using Ge nanocrystals embedded in HfAlO high-k tunneling and control oxides: Device fabrication and electrical performance
    • Nov
    • J. H. Chen, Y. Q. Wang, W. J. Yoo, Y.-C. Yeo, G. Samudra, D. S. H. Chan, A. Y. Du, and D.-L. Kwong, "Nonvolatile Flash memory device using Ge nanocrystals embedded in HfAlO high-k tunneling and control oxides: Device fabrication and electrical performance," IEEE Trans. Electron Devices, vol. 51, no. 11, pp. 1840-1848, Nov. 2004.
    • (2004) IEEE Trans. Electron Devices , vol.51 , Issue.11 , pp. 1840-1848
    • Chen, J.H.1    Wang, Y.Q.2    Yoo, W.J.3    Yeo, Y.-C.4    Samudra, G.5    Chan, D.S.H.6    Du, A.Y.7    Kwong, D.-L.8
  • 9
    • 0842266586 scopus 로고    scopus 로고
    • Operational and reliability comparison of discrete-storage nonvolatile memories: Advantages of single- and double-layer metal nanocrystals
    • C. Lee, A. Gorur-Seetharam, and E. C. Kan, "Operational and reliability comparison of discrete-storage nonvolatile memories: Advantages of single- and double-layer metal nanocrystals," in IEDM Tech. Dig., 2003, pp. 557-560.
    • (2003) IEDM Tech. Dig , pp. 557-560
    • Lee, C.1    Gorur-Seetharam, A.2    Kan, E.C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.