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Volumn 477, Issue 1, 2001, Pages 25-34

Nanotribology of carbon based thin films: The influence of film structure and surface morphology

(4) Riedo, E a Chevrier, J a,b Comin, F a Brune, H a

b LABORATOIRE DE CRISTALLOGRAPHIE (France)

Author keywords

Atomic force microscopy; Carbon; Friction; Nitrides; Raman scattering spectroscopy; Surface structure, morphology, roughness, and topography; Tribology

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; CARBON NITRIDE; COMPOSITION EFFECTS; FRICTION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; RAMAN SPECTROSCOPY; SURFACE ROUGHNESS; THIN FILMS; TRIBOLOGY;

NANOTRIBOLOGY;

AMORPHOUS FILMS;

EID: 0035836650 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)00701-4 Document Type: Article

Times cited : (71)

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