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Volumn 75, Issue 15, 2007, Pages

Limits of the scaled shift correction to levels of interstitial defects in semiconductors

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EID: 34247344098     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.153204     Document Type: Article
Times cited : (15)

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