Investigation of molecular weight effects of polystyrene in ToF-SIMS using C 60 + and Au + primary ion beams

Applied Surface Science

Volumn 255, Issue 4, 2008, Pages 912-915

  Piwowar, Alan M ^a   Lockyer, Nicholas ^a   Vickerman, John C ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Au +; C 60 +; Polymer molecular weight; Polystyrene; ToF SIMS

Indexed keywords

ION SOURCES; MOLECULAR WEIGHT; MULTILAYER FILMS; POLYSTYRENES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

C60^+; MOLECULAR WEIGHT EFFECT; POLYATOMIC ION SOURCES; POLYMER MOLECULAR WEIGHT; ROLE OF MOLECULAR WEIGHTS; SECONDARY ION YIELD; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

ION BEAMS;

EID: 56749172687     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.177     Document Type: Article

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