Surface segregational behaviour studied as an effect of thickness by SIMS and AFM in annealed PS-PMMA blend and block copolymer thin films

Composite Interfaces

Volumn 13, Issue 4-6, 2006, Pages 423-439

  Kailas, L ^a   Audinot, J N ^b   Migeon, H N ^b   Bertrand, P ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY   (Luxembourg)

Author keywords

AFM; Diblock copolymers; Morphology; Nano SIMS; Phase separation; Surface characterization; Symmetric blends; Thin films; ToF SIMS

Indexed keywords

NANO-SIMS; SURFACE CHARACTERIZATION; SYMMETRIC BLENDS; TOF-SIMS;

ANNEALING; ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; MASS SPECTROMETERS; MOLECULAR STRUCTURE; MORPHOLOGY; PHASE SEPARATION; POLYMER BLENDS; STRUCTURE (COMPOSITION); THIN FILMS;

SECONDARY ION MASS SPECTROMETRY;

EID: 33746060958     PISSN: 09276440     EISSN: None     Source Type: Journal    
DOI: 10.1163/156855406777408610     Document Type: Conference Paper

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