Texture analysis with the new HIPPO TOF diffractometer

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 515, Issue 3, 2003, Pages 575-588

  Wenk, H R ^a   Lutterotti, L ^a   Vogel, S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Neutron diffraction; Rietveld; Texture analysis

Indexed keywords

DIFFRACTOMETERS; GONIOMETERS; LIMESTONE; NEUTRON DETECTORS; NEUTRON SCATTERING; VACUUM FURNACES; X RAY DIFFRACTION ANALYSIS;

TEXTURE ANALYSIS;

NUCLEAR INSTRUMENTATION;

EID: 0242691151     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.05.001     Document Type: Article

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