Structural, optical and ac conduction properties of Bi2V1-xNbxO5.5 (0 ≤ x ≤ 0.4) thin films fabricated by pulsed laser deposition technique

Materials Science and Engineering: B

Volumn 153, Issue 1-3, 2008, Pages 36-46

  Kumari, Neelam ^a   Varma, K B R ^a   Krupanidhi, S B ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

ac conductivity; Bismuth vanadate; Optical transmission; Thin film; Universal dielectric response

Indexed keywords

ACTIVATION ENERGY; BISMUTH; BISMUTH COMPOUNDS; DIELECTRIC LOSSES; ENERGY GAP; GLASS; GLASS SUBSTRATES; LIGHT TRANSMISSION; NIOBIUM; OXYGEN VACANCIES; PEROVSKITE; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY;

A.C CONDUCTIVITY; A.C. CONDUCTIVITY; AC CONDUCTION; AC CONDUCTIVITY; BISMUTH VANADATES; CONDUCTION PROPERTIES; NB DOPED; OPTICAL-; THIN-FILMS; UNIVERSAL DIELECTRIC RESPONSE;

THIN FILMS;

EID: 56549107686     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2008.09.021     Document Type: Article

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