Probing field emission from boron carbide nanowires

Chinese Physics Letters

Volumn 25, Issue 9, 2008, Pages 3463-3466

  Tian, Ji Fa ^a   Bao, Li Hong ^a   Wang, Xing Jun ^a   Hui, Chao ^a   Liu, Fei ^b   Li, Chen ^a   Shen, Cheng Min ^a   Wang, Zong Li ^a   Gu, Chang Zhi ^a   Gao, Hong Jun ^a  

^a INSTITUTE OF PHYSICS   (China)

^b SUN YAT SEN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BORON CARBIDE; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISSIPATION; FIELD EMISSION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; ION BEAMS;

CARBON-THERMAL REDUCTION; ELECTRONS ENERGY; ENERGY LOST; ENHANCEMENT FACTOR; FIELD EMISSION CURRENTS; FIELD EMISSION MEASUREMENTS; FOCUSED-ION-BEAM SYSTEM; PROBING FIELD; REDUCTION TECHNIQUES; SYNTHESISED;

NANOWIRES;

EID: 56349138150     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/25/9/099     Document Type: Article

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