Diamond and boron carbide field emission in medium vacuum

Surface and Interface Analysis

Volumn 39, Issue 2-3, 2007, Pages 123-127

  Melmed, Allan J ^a,b  

^a Custom Probes Unlimited   (United States)

^b NONE   (United States)

Author keywords

Boron carbide; Current stability; Diamond; Electron emission; Field electron microscopy; Field ion microscopy

Indexed keywords

BORON CARBIDE; DIAMONDS; ELECTRIC CURRENTS; SCANNING ELECTRON MICROSCOPY; VACUUM; VOLTAGE MEASUREMENT;

CURRENT STABILITY; FIELD ELECTRON MICROSCOPE (FEM); FIELD ION MICROSCOPY (FIM);

ELECTRON EMISSION;

EID: 33847047136     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2473     Document Type: Conference Paper

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