Radiation performance of 1 Gbit DDR2 SDRAMs fabricated with 80-90 nm CMOS

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2008, Pages 42-46

  Ladbury, R ^a   Berg, M D ^a   LaBel, K A ^a   Friendlich, M ^a   Phan, A ^a   Kim, H ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

Text

Indexed keywords

IONIZING RADIATION; RADIATION; TECHNICAL PRESENTATIONS;

90NM CMOS; NONDESTRUCTIVE; RADIATION PERFORMANCES; TEXT; TID DAMAGES;

RADIATION EFFECTS;

EID: 56349119553     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2008.14     Document Type: Conference Paper

References (10)

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4. R. Harboe-Sorensen, "Heavy-Ion SEE Test Concept and Results for DDR-II Memories," IEEE Trans. Nucl. Sci. Vol. 54, No. 6, pp. 2125-2130, December 2007.
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6. J. Benedetto, "Examination of Single Event Functional Interrupts (SEFIs) in COTS SDRAMS," 2006 Single-Event Effects Symposium, Long Beach, CA, April 10-12, 2006.
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8. Micron Technology, Inc., "DDR2 SDRAM," April 2008.
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10. J. W. Howard, "Development of a Low-Cost and High-Speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)," 2006 Single-Event Effects Symposium, Long Beach, CA, April 10-12, 2006.