SEE sensitivity determination of high-density DRAMs with limited-range heavy ions

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 182-189

  Koga, R ^a   Crain, S H ^a   Yu, P ^a   Crawford, K B ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAVY IONS; ION BEAMS; IRRADIATION; SENSITIVITY ANALYSIS;

SINGLE EVENT EFFECT (SEE) MEASUREMENTS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0035174450     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. SDRAM space radiation effects measurements and analysis
2. Single-event-effect ground test issues
3. Single event functional interrupt (SEFI) sensitivity in microcircuits
4. An empirical model for predicting proton induced upset