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Volumn 56, Issue 20, 2008, Pages 6205-6213
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On the effect of a general residual stress state on indentation and hardness testing
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Author keywords
Analytical methods; Hardness test; Nanoindentation; Residual stresses; Yield phenomena
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Indexed keywords
CONCRETES;
ELECTRONIC EQUIPMENT TESTING;
FILMS;
HARDNESS;
HARDNESS TESTING;
MATERIALS TESTING;
MECHANICAL PROPERTIES;
RESIDUAL STRESSES;
STRAIN;
STRENGTH OF MATERIALS;
THICK FILMS;
UNCERTAINTY ANALYSIS;
ANALYTICAL METHODS;
BIAXIALITY;
CONTACT PRESSURES;
FLOW RULES;
MEASUREMENT UNCERTAINTIES;
NEW MODELS;
NON LINEARITIES;
RESIDUAL STRESS STATES;
STRESS FIELDS;
STRESS RATIOS;
STRESS STRAINS;
VOLUME OF INTERESTS;
VON MISES;
WELDED MATERIALS;
YIELD PHENOMENA;
STRESSES;
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EID: 56149113933
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2008.08.029 Document Type: Article |
Times cited : (146)
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References (27)
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