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Volumn , Issue , 2008, Pages 391-395

Deformation reduction of a MEMS sensor by stress balancing of multilayer

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MICROMECHANICS; DEFORMATION; MEMS; MICROELECTROMECHANICAL DEVICES; MICROMACHINING; MULTILAYERS; PHOTORESISTS; POLYIMIDES; POLYMERS; SENSOR NETWORKS; SENSORS; SILICON; STRENGTH OF MATERIALS; WIRELESS NETWORKS;

EID: 55849127460     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSORCOMM.2008.81     Document Type: Conference Paper
Times cited : (4)

References (7)
  • 1
    • 0000241036 scopus 로고    scopus 로고
    • On the buckling behavior of micromachined beams
    • W. Fang, C-H. Lee, and H-H. Hu, "On the buckling behavior of micromachined beams", J. Micromech. Microeng., vol. 9, 1999, pp. 236-244.
    • (1999) J. Micromech. Microeng , vol.9 , pp. 236-244
    • Fang, W.1    Lee, C.-H.2    Hu, H.-H.3
  • 2
    • 0030230992 scopus 로고    scopus 로고
    • Determining mean and gradient residual stresses in thin films using micromachined cantilevers
    • W. Fang and J.A. Wickert, "Determining mean and gradient residual stresses in thin films using micromachined cantilevers", J. Micromech. Microeng., vol. 6, 1996, pp. 301-309.
    • (1996) J. Micromech. Microeng , vol.6 , pp. 301-309
    • Fang, W.1    Wickert, J.A.2
  • 3
    • 15544378552 scopus 로고    scopus 로고
    • Determination of mechanical properties of PECVD silicon nitride thin films for tunable MEMS Fabry-Perot optical filters
    • H. Huang, K. Winchester, Y. Liu, X.Z. Hu, C.A. Musca, J.M. Dell, and L. Faraone, "Determination of mechanical properties of PECVD silicon nitride thin films for tunable MEMS Fabry-Perot optical filters", J. Micromech. Microeng., vol. 15, 2005, pp. 608-614.
    • (2005) J. Micromech. Microeng , vol.15 , pp. 608-614
    • Huang, H.1    Winchester, K.2    Liu, Y.3    Hu, X.Z.4    Musca, C.A.5    Dell, J.M.6    Faraone, L.7
  • 4
    • 1642603471 scopus 로고    scopus 로고
    • A. Tarraf, J. Daleiden, S. Irmer, D. Prasai, and H. Hillmer, Stress investigation of PECVD dielectric layers for advanced optical MEMS, J. Micromech. Microeng., 14, 2004, pp. 317.-323.
    • A. Tarraf, J. Daleiden, S. Irmer, D. Prasai, and H. Hillmer, "Stress investigation of PECVD dielectric layers for advanced optical MEMS", J. Micromech. Microeng., vol. 14, 2004, pp. 317.-323.
  • 5
    • 0034469351 scopus 로고    scopus 로고
    • A new technique for producing large-area as-deposited zero-stress LPCVD polysilicon films: The MultiPoly process
    • J. Yang, H. Kahn, A-Q. He, S.M. Philips, and A.H. Heuer, "A new technique for producing large-area as-deposited zero-stress LPCVD polysilicon films: the MultiPoly process", J. MEMS, vol. 9, 2000, pp. 485-494.
    • (2000) J. MEMS , vol.9 , pp. 485-494
    • Yang, J.1    Kahn, H.2    He, A.-Q.3    Philips, S.M.4    Heuer, A.H.5
  • 6
    • 0036772610 scopus 로고    scopus 로고
    • Elimination of stress-induced curvature in thin-film structures
    • T.G. Bifano, H.T. Johnson, P. Bierden, and R.K. Mali, "Elimination of stress-induced curvature in thin-film structures", J. MEMS, vol. 11, 2002, pp. 592-597.
    • (2002) J. MEMS , vol.11 , pp. 592-597
    • Bifano, T.G.1    Johnson, H.T.2    Bierden, P.3    Mali, R.K.4
  • 7
    • 11044229559 scopus 로고    scopus 로고
    • Residual stresses in sputterdeposited copper/330 stainless steel multilayers
    • X. Zhang and A. Misra, "Residual stresses in sputterdeposited copper/330 stainless steel multilayers", J. Appl. Phys., vol. 96, 2004, pp.7173-7178.
    • (2004) J. Appl. Phys , vol.96 , pp. 7173-7178
    • Zhang, X.1    Misra, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.