Shear induced relaxation of polymer micelles at the solid-liquid interface

Langmuir

Volumn 24, Issue 20, 2008, Pages 11331-11333

  Wolff, Max ^a,d   Steitz, Roland ^b   Gutfreund, Philipp ^a   Voss, Nicole ^c   Gerth, Stefan ^c   Walz, Marco ^c   Magerl, Andreas ^c   Zabel, Hartmut ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^d INSTITUT LAUE LANGEVIN   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABS RESINS; COLLOIDS; ETHYLENE; FLOW INTERACTIONS; INSECTICIDES; MICELLES; POLYMERS; PROPYLENE; SHEAR DEFORMATION; SHEAR FLOW; SILICON; SOLUTIONS;

AQUEOUS SOLUTIONS; CRYSTALLINE STRUCTURES; ETHYLENE OXIDES; FAST RELAXATIONS; LIQUID INTERFACES; POLYMER MICELLES; PROPYLENE OXIDES; SHEAR FORCES; SHEAR RATES; SILICON WALLS; SLOW RELAXATIONS; THICK LAYERS; WALL INTERACTIONS;

PHASE INTERFACES;

EID: 55549128920     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la801945q     Document Type: Article

References (27)

1. Alexandritis, P.; Lindman, B. Amphiphilic Block Copolymers, 1st ed.; Elsevier Science: Amsterdam, 2000; p 1.
2. Förster, S.; Timmann, A.; Schellbach, C.; Förmsdorf, A.; Kornowski, A.; Weller, H.; Roth, S. V.; Lindner, P. Nat. Mater. 2007, 6, 888.
3. Wolff, M.; Magerl, A.; Zabel, H. Thin Solid Films 2007, 515, 5724.
4. Wolff, M.; Scholz, U.; Hock, R.; Magerl, A.; Leiner, V.; Zabel, H. Phys. Rev. Lett. 2004, 92, 255501.
5. Wolff, M.; Magerl, A.; Zabel, H. Euro. Phys. J. E 2005, 16(2), 141.
6. Wolff, M.; Magerl, A.; Zabel, H. Physica B 2005, 357, 84.
7. Hamilton, W. A.; Butler, P. D.; Magid, L. J.; Han, Z.; Slawecki, T. M. Phys. Ref. E 1999, 60, R1146.
8. Timmann, A.; Roth, S. V.; Fischer, S.; Förster, S. Appl. Phys. Lett. 2007, 91, 213102.
9. Moulin, J. F.; Roth, S. V.; Müller-Buschbaum, P. Rev. Sci. Instrum. 2001, 72, 4305.
10. Hamley, I. W. Phil. Trans. R. Soc. London, Ser. A 2001, 359, 1017.
11. Panine, P.; Gradzielski, M.; Narayanan, T. Rev. Sci. Instrum. 2003, 74, 2451.
12. Habas, J.-P.; Pavie, E.; Perreur, C.; Lapp, A.; Peyrelasse, J. Phys. Rev. E 2004, 70, 061802.
13. Mortensen, K. J. Polym. Sci., Part B: Polym. Phys. 2004, 42, 3092.
14. Förster, S.; Konrad, M.; Lindner, P. Phys. Rev. Lett. 2005, 94, 017803.
15. Polushkin, E.; Bondzic, S.; De Wit, J.; Ekenstein, G. A.; Dolbnya, I.; Bras, W.; Ikkala, O.; ten Brinke, G. Macromolecules 2005, 38, 1804.
16. Ludwigs, S.; Boker, A.; Voronov, A.; Rehse, N.; Magerle, R.; Krausch, G. Nat. Mater. 2003, 2, 744.
17. Register, R. A. Nature (London) 2003, 424, 378.
18. Kim, S. O.; Solak, H. H.; Stoykovich, M. P.; Ferner, N. J.; de Pablo, J. J.; Nealey, P. F. Nature (London) 2003, 424, 411.
19. Rosa, C.; Park, C.; Thomas, E. L.; Lotz, B. Nature (London) 2000, 405, 433.
20. Cheng, J. Y.; Ross, C. A.; Thomas, E. L.; Smith, H. I.; Vancso, G. J. Appl. Phys. Lett. 2002, 81, 3657.
21. Mortensen, K. Polym. Adv. Technol. 2001, 12, 2.
22. Data during shear were taken for 15 min after preshearing of the sample for 60 s to reach the steady state.
23. The GISANS scattering pattern shown was corrected for refractive distortion. Further information on data correction in GISANS measurements can be found in, e.g.: Hamilton, W. A.; Butler, P. D.; Hayter, J. B.; Magid, L. J.; Kreke, P. J. Physica B 1996, 221, 309.
24. Eiser, E.; Molino, F.; Porte, G.; Diat, O. Phys. Rev. E 2000, 61, 6759.
25. Gerstenberger, M. C.; Pedersen, J. S.; Smith, G. S. Phys. Rev. E 1998, 58, 8028.
26. Gerstenberger, M. C.; Pedersen, J. S.; Majewski, J.; Smith, G. S. Langmuir 2002, 18, 4933.
27. Neto, C.; Evans, D. R.; Bonaccurso, E.; Butt, H.-J.; Craig, V. S. J. Rep. Prog. Phys. 2005, 68, 2859.