NS-SANS for the investigation of micellar systems

Thin Solid Films

Volumn 515, Issue 14 SPEC. ISS., 2007, Pages 5724-5727

  Wolff, M ^a,b   Magerl, A ^c   Zabel, H ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b INSTITUT LAUE LANGEVIN   (France)

^c UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Micelles; Neutron reflectivity; NS SANS; SANS; Three block polymers

Indexed keywords

BLOCK COPOLYMERS; INTERFACES (MATERIALS); NEUTRON REFLECTION; NEUTRON SCATTERING; SURFACE PHENOMENA;

GRAZING INCIDENT BEAM GEOMETRY; NS-SANS; SURFACE SENSITIVITY; THREE BLOCK POLYMERS;

MICELLES;

EID: 34247160005     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.12.024     Document Type: Article

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