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Volumn 78, Issue 15, 2008, Pages

Breakdown of cation vacancies into anion vacancy-antisite complexes on III-V semiconductor surfaces

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EID: 55449098829     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.155318     Document Type: Article
Times cited : (3)

References (32)
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    • Note that in Ref. the defect complex was labeled as VIn.
    • Note that in Ref. the defect complex was labeled as VIn
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