High resolution hard x-ray microscope on a second generation synchrotron source

Review of Scientific Instruments

Volumn 79, Issue 10, 2008, Pages

  Tian, Yangchao ^a   Li, Wenjie ^a   Chen, Jie ^a   Liu, Longhua ^a   Liu, Gang ^a   Tkachuk, Andrei ^b   Tian, Jinping ^a   Xiong, Ying ^a   Gelb, Jeff ^b   Hsu, George ^b   Yun, Wenbing ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b XRADIA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GROWTH (MATERIALS); IMAGE RESOLUTION; MATERIALS; MICROSCOPES; SYNCHROTRONS; X RAY APPARATUS; X RAY MICROSCOPES;

ANALYTICAL TOOLS; EMITTANCE; ENERGY RANGES; ENVIRONMENTAL SCIENCES; EXPOSURE TIMES; HIGH QUALITIES; HIGH RESOLUTIONS; NANOSCALE; NATIONAL SYNCHROTRON RADIATION LABORATORIES; OPTICAL COMPONENTS; PHOTON FLUXES; SAMPLE POSITIONS; SECOND GENERATIONS; SPATIAL RESOLUTIONS; STRUCTURAL IMAGING; SYNCHROTRON SOURCES; ZERNIKE PHASE CONTRASTS;

X RAYS;

EID: 55349125684     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3002484     Document Type: Conference Paper

References (28)

1. W. Chao, B. D. Harteneck, J. A. Liddle, E. H. Anderson, and D. T. Attwood, Nature (London) 0028-0836 10.1038/nature03719 435, 1210 (2005).
2. M. Awaji, Y. Suzuki, A. Takeuchi, H. Takano, N. Kamijo, S. Tamura, and M. Yasumoto, Nucl. Instrum. Methods Phys. Res. A 467, 845 (2001).
3. U. Neuhäusler, G. Schneider, W. Ludwig, M. A. Meyer, E. Zschech, and D. Hambach, J. Phys. D 0022-3727 10.1088/0022-3727/36/10A/316 36, A79 (2003).
4. H. S. Youn, S. Y. Baik, and C. H. Chang, Rev. Sci. Instrum. 0034-6748 10.1063/1.1841812 76, 023702 (2005).
5. G. C. Yin, M. T. Tang, Y. F. Song, F. R. Chen, K. S. Liang, F. W. Duewer, W. Yun, C. H. Ko, and H. P. Shieh, Appl. Phys. Lett. 0003-6951 10.1063/1.2211300 88, 241115 (2006).
6. Y. S. Chu, J. M. Yi, F. De Carlo, Q. Shen, W. -K. Lee, H. J. Wu, C. L. Wang, J. Y. Wang, C. J. Liu, C. H. Wang, S. R. Wu, C. C. Chien, Y. Hwu, A. Tkachuk, W. Yun, M. Feser, K. S. Liang, C. S. Yang, J. H. Je, and G. Margaritondo, Appl. Phys. Lett. 0003-6951 10.1063/1.2857476 92, 103119 (2008).
7. J. Chen, C. Wu, J. Tian, W. Li, S. Yu, and Y. Tian, Appl. Phys. Lett. 0003-6951 10.1063/1.2943337 92, 233104 (2008).
8. G. Schmahl, D. Rudolph, G. Schneider, P. Guttmann, and B. Niemann, Optik (Stuttgart) 97, 181 (1994).
9. T. J. Davis, D. Gao, T. E. Gureyev, A. W. Stevenson, and S. W. Wilkins, Nature (London) 0028-0836 10.1038/373595a0 373, 595 (1995).
10. S. W. Wilkins, T. E. Gureyev, D. Gao, A. Pogany, and A. W. Stevenson, Nature (London) 0028-0836 10.1038/384335a0 384, 335 (1996).
11. K. A. Nugent, T. E. Gureyev, D. F. Cookson, D. Paganin, and Z. Barnea, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.77.2961 77, 2961 (1996).
12. D. Chapman, W. Thomlinson, R. E. Johnston, D. Washburn, E. Pisano, N. Gmür, Z. Zhong, R. Menk, F. Arfelli, and D. Sayers, Phys. Med. Biol. 0031-9155 10.1088/0031-9155/42/11/001 42, 2015 (1997).
13. P. Cloetens, W. Ludwig, J. Baruchel, D. Van Dyck, J. Van Landuyt, J. P. Guigay, and M. Schlenker, Appl. Phys. Lett. 0003-6951 10.1063/1.125225 75, 2912 (1999).
14. A. Momose, Opt. Express 11, 2303 (2003). 1094-4087
15. F. Pfeiffer, T. Weitkamp, O. Bunk, and C. David, Nat. Phys. 2, 258 (2006).
16. C. Xu, W. Zhao, G. Pan, Y. Liu, G. Wu, H. Li, and D. Zhao, Nucl. Instrum. Methods Phys. Res. A 0168-9002 10.1016/S0168-9002(98)00202-2 410, 293 (1998).
17. G. Pan, C. Xu, R. Fan, C. Gao, X. Lou, M. Teng, Q. Huang, and L. Niu, Nucl. Instrum. Methods Phys. Res. A 0168-9002 10.1016/j.nima.2004.12.003 540, 480 (2005).
18. J. Thieme, G. Schmahl, E. Umbach, and D. Rudolph, X-Ray Microscopy and Spectromicroscopy (Springer, Berlin, 1998).
19. H. Winick and S. Doniach, Synchrotron Radiation Research (Plenum, New York, 1980), p. 503.
20. A. A. MacDowell, D. Norman, and J. B. West, Rev. Sci. Instrum. 0034-6748 10.1063/1.1139077 57, 2667 (1986).
21. B. Lai, W. B. Yun, D. Legnini, Y. Xiao, J. Chrzas, P. J. Viccaro, V. White, S. Bajikar, D. Denton, F. Cerrina, E. Di Fabrizio, M. Gentili, L. Grella, and M. Baciocchi, Appl. Phys. Lett. 0003-6951 10.1063/1.108400 61, 1877 (1992).
22. W. B. Yun, B. Lai, Z. Cai, J. Maser, D. Legnini, E. Gluskin, Z. Chen, A. A. Krasnoperova, Y. Vladimirsky, F. Cerrina, E. Di Fabrizio, and M. Gentili, Rev. Sci. Instrum. 0034-6748 10.1063/1.1149744 70, 2238 (1999).
23. W. B. Yun, B. Lai, A. Krasnoperova, E. Di Fabrizio, Z. Cai, F. Cerrina, Z. Chen, M. Gentili, and E. Gluskin, Rev. Sci. Instrum. 0034-6748 10.1063/1.1149956 70, 3537 (1999).
24. E. Di Fabrizio, F. Romanato, M. Gentili, S. Cabrini, B. Kaulich, J. Susini, and R. Barrett, Nature (London) 0028-0836 10.1038/44791 401, 895 (1999).
25. X. Zeng, F. Duewer, M. Feser, C. Huang, A. Lyon, A. Tkachuk, and W. Yun, Appl. Opt. 0003-6935 10.1364/AO.47.002376 47, 2376 (2008).
26. M. Born and E. Wolf, Principles of Optics (Cambridge University Press, New York, 1999).
27. A. C. Kak and M. Slaney, Principles of Computerized Tomographic Imaging (IEEE, New York, 1988).
28. Y. Feng, M. Feser, A. Lyon, S. Rishton, X. Zeng, S. Chen, S. Sassolini, and W. Yun, J. Vac. Sci. Technol. B 1071-1023 10.1116/1.2789447 25, 2004 (2007).