X-ray imaging microscopy at 25 keV with Fresnel zone plate optics

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 467-468, Issue PART II, 2001, Pages 845-848

  Awaji, M ^a   Suzuki, Y ^a   Takeuchi, A ^a   Takano, H ^a   Kamijo, N ^a,b   Tamura, S ^a,c   Yasumoto, M ^c  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b KANSAI MEDICAL UNIVERSITY   (Japan)

^c OSAKA NATIONAL RESEARCH INSTITUTE   (Japan)

Author keywords

Diffuser; Imaging hard x ray microscopy; Incoherent illumination; Speckle noise; Sputtered sliced Fresnel zone plate; Undulator radiation

Indexed keywords

EID: 0000216055     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)00489-2     Document Type: Article

References (5)

1. D. Rudolph, G. Schmahl, SPIE 342 (1980) 94;
2. D. Rudolph, G. Schmahl, SPIE 316 (1981) 103.
3. S. Tamura, K. Mori, T. Maruhashi, K. Yoshida, K. Ohtani, N. Kamijo, Y. Suzuki, H. Kihara, Mater. Res. Soc. Sympos. Proc. 441 (1997) 779.
4. H. Kitamura, J. Synchrotr. Radiat. 5 (1998) 184.
5. D.L. White, O.R. Wood II, J.E. Bjorkholm, S. Spector, A.A. MacDowell, B. LaFontaine, Rev. Sci. Instrum. 66 (1995) 1930.