Analysis and selection criteria of BSIM4 flicker noise simulation models

International Journal of Circuit Theory and Applications

Volumn 36, Issue 7, 2008, Pages 813-823

  Noulis, T ^a   Siskos, S ^a   Sarrabayrouse, G ^b  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b LAAS CNRS   (France)

Author keywords

BSIM4 MOSFET model; Flicker noise exponent; SPICE flicker and BSIM flicker noise models

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; MOSFET DEVICES; SPURIOUS SIGNAL NOISE; TRANSISTORS;

1/F NOISES; AUSTRIA; BIAS CONDITIONS; BSIM4 MOSFET MODEL; CMOS TRANSISTORS; FLICKER NOISE EXPONENT; FLICKER NOISE MODELS; FLICKER NOISES; LINEAR REGIMES; MOS FETS; NMOS TRANSISTORS; NOISE MEASUREMENTS; NOISE PERFORMANCES; OPERATING REGIONS; PMOS DEVICES; PMOS TRANSISTORS; SATURATION REGIONS; SIMULATION MODELS;

SPICE;

EID: 55349114390     PISSN: 00989886     EISSN: 1097007X     Source Type: Journal    
DOI: 10.1002/cta.461     Document Type: Article

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