Different noise mechanisms in high-k dielectric gate stacks

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5844, Issue , 2005, Pages 177-184

  Çelik Butler, Zeynep ^a  

^a University of Texas at Arlington   (United States)

Author keywords

High k dielectric; Low frequency noise; MOSFET

Indexed keywords

CARRIER NUMBERS; HIGH-K DIELECTRICS; LOW-FREQUENCY NOISE; MOBILITY FLUCTUATIONS;

CARRIER MOBILITY; DIELECTRIC MATERIALS; MOSFET DEVICES;

SPURIOUS SIGNAL NOISE;

EID: 28444466960     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.611250     Document Type: Conference Paper

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