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Volumn 112, Issue 1, 2008, Pages 88-93

Enhanced field emission from density-controlled SiC nanowires

Author keywords

Field emission; Nanowires; Sic; Thermal evaporation; X ray diffraction

Indexed keywords

CATALYSTS; ELECTRON MICROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; FIELD EMISSION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; THERMAL EVAPORATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY SPECTROSCOPY;

EID: 55349102999     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2008.05.024     Document Type: Article
Times cited : (82)

References (33)
  • 30
    • 0033645251 scopus 로고    scopus 로고
    • W. Gruner, S. Stole, K. Wetzig, Int. J. Ref. Metals Hard Mater. 18 (2000) 137.
    • W. Gruner, S. Stole, K. Wetzig, Int. J. Ref. Metals Hard Mater. 18 (2000) 137.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.