Time-dependent RF performance degradation modeling of AlGaN/GaN HFETs

2008 17th International Conference on Microwaves, Radar and Wireless Communications, MIKON 2008

Volumn , Issue , 2008, Pages

  Trew, J ^a   Kuang, W ^a   Liu, Y ^a   Bilbro, G L ^a  

^a North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGAN/GAN HETEROJUNCTIONS; ALGAN/GAN HFETS; DC CURRENTS; FUNCTION OF TIMES; GATE ELECTRODES; HIGH VOLTAGES; OUTPUT POWERS; PHYSICS-BASED; RELIABILITY PROBLEMS; RF CIRCUITS; RF PERFORMANCES; SEMI-CONDUCTORS; SIMULATED DATUMS; TUNNELING MECHANISMS;

GALLIUM NITRIDE; MICROWAVES; NITRIDES; RADAR; RADIO WAVES; SIMULATORS;

RELIABILITY;

EID: 55149120164     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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