|
|
Volumn 47, Issue 7 PART 3, 2008, Pages 6186-6189
|
|
Estimation of three-dimensional atomic force microscope tip shape from atomic force microscope image for accurate measurement
a
|
|
Author keywords
Atomic force microscope; C AFM; Image processing; Surface reconstruction; Tip shape estimation
|
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
COLUMNS (STRUCTURAL);
CRYSTAL ORIENTATION;
DIGITAL IMAGE STORAGE;
IMAGE PROCESSING;
IMAGING SYSTEMS;
IMPULSE RESPONSE;
MICROSCOPES;
MICROSCOPIC EXAMINATION;
STANDARDS;
ACCURATE MEASUREMENTS;
AFM IMAGES;
ATOMIC FORCE MICROSCOPE;
ATOMIC FORCE MICROSCOPE IMAGES;
ATOMIC FORCE MICROSCOPES;
C-AFM;
ELIMINATION TECHNIQUES;
ESTIMATION METHODS;
SMALL DIAMETERS;
STANDARD SAMPLES;
TIP SHAPE ESTIMATION;
TIP SHAPES;
TIP STRUCTURES;
THREE DIMENSIONAL;
|
|
EID: 55149109900
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.47.6186 Document Type: Article |
|
Times cited : (9)
|
|
References (12)
|
