SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 53, Issue 4, 1994, Pages 371-380

Evaluation of the probing profile of scanning force microscopy tips

(4) Sheiko, S S a Moller M a Reuvekamp, E M C M a Zandbergen, H W b

a UNIVERSITY OF TWENTE (Netherlands)

b DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTALS; HIGH TEMPERATURE APPLICATIONS; IMAGE PROCESSING; RELIABILITY; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; SURFACE TREATMENT; SURFACES;

ATOMIC FORCE MICROSCOPY; FLAT CRYSTAL SURFACE; HIGH TEMPERATURE TREATED SURFACE; IMAGE DISTORTION; SCANNING FORCE MICROSCOPY TIPS; TIP SHAPE DEPENDENT ARTIFACTS;

MICROSCOPIC EXAMINATION;

ARTICLE; ATOMIC FORCE MICROSCOPY;

EID: 0028417212 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/0304-3991(94)90050-7 Document Type: Article

Times cited : (43)

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